LLS Laser Instrumentation Division

Laser Farfield Beam Analyizer.


LLS has developed a beam profiler that meets the needs of the most demanding research lab and production line. The LLS gonio has high resolution beam sampling of 0.1 degrees of both the fast and slow axis with scan times of <1 second. It operates with a dual band detector system that allows for a wide range of wavelngth devices to be analyzed. Combined with a powerful software and USB data interface this system provides high accuracy and high reliablibity in a production environment with ease of integration into existing test and evaluation systems.

FAC Alignment Pulse Driver (with dual peak detection and touch technology).

LLS 8801 FAC Driver Datasheet

LLS FAC alignment system with dual peak detection incorporates a laser driver (CW 3A pulsed 10A), a TEC controller, and dual detector feedback inputs for total control at you FAC alignment station. The driver has intuitive touch screen controls for current, temperature, and detector peak control. The driver brings all the control and feedback into one compact unit and speeds up the FAC alignment process in a demanding production or research environment.

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Custom Solutions.


LLS has vast design capabilities that include many years of experience in the following areas: 

> Mechanical Design (packaging, fixtures) using Solidworks, Autocad

> Electrical design, circuit board layout (analog, digital)

> Optical design (bulk optics, micro-optics)

> Programming C#, Labview,  SQL, microprocessor

> Military and Medical product certification

     Projects can be implemented using a variety of Quality/regulatory specifications

> ISO9001:2008

> CE

> Mil Standards

> Medical Standards

> FDA Laser Safety